Dr. Fangzhou Zhao wins the Corbett Prize at the 32nd International Conference on Defects in Semiconductors (ICDS)
Dr. Zhao was awarded the Corbett Prize for his work on Trap-Assisted Auger-Meitner recombination.
Dr. Fangzhou Zhao received the Corbett Prize at the 32nd International Conference on Defects in Semiconductors (ICDS) for his work on Trap-Assisted Auger-Meitner recombination. Five finalists, selected from the nominees, gave presentations at the conference, and finally 2 winners were selected by the Corbett Prize Committee.
The Corbett Prize is named after James W. Corbett who consistently helped and promoted young researchers in the field of defects in semiconductors. At each ICDS, the Corbett Prize is given to the best early career researcher(s) who have received their PhD within 5 years of the first day of the conference.
Dr. Fangzhou Zhao also gave an invited talk "Trap-Assisted Auger-Meitner recombination from first principles" at the conference.
